講座名稱：The reliability challenge for advanced technologies: A critical concern for research, production, economy and modern society
主講人：Yves Danto
主講人簡介：Yves DANTO received the Ph.D degree in electronics from the University of Bordeaux, France, in 1967. He joined IMS Lab (Integration; Materials and Systems) in 1981, where he was in charge to develop a new team in device failure analysis. Appointed full professor in 1982, he managed the reliability research group of IMS, was head of the Electronics Teaching Department of the University of Bordeaux., and member of the National University Council. He concentrated his research on developping new concepts on reliability physics, as well as technological and design solutions to answer the very high reliability challenge that has to face industry in the last years. He published around 200 research papers in International journals and conferences, and about 30 teaching papers in international conferences. He is currently Emeritus retired Professor.
List of areas of expertise relating to device reliability: Reliability physics accelerated testing, failure mechanisms, failure analysis, devices and IC technologies, reliability prediction.
請特别注意，由于是同一主題的系列講座，先導講座必須聆聽，否則難以理解後續講座内容。單獨聆聽先導講座不可作為課外研學講座。聆聽先導講座及其後續任意一場，可作為一場課外研學講座。除先導講座外，每場講座可單獨撰寫報告，作為課外研學講座考核要求。
報告内容：
先導講座（必聽）:Basics of reliability
- The Reliability challenge
- Basics definitions; statistical approach
- Mean life time and Failure distributions
時間：10月15日18:30-20:55；地點：九龍湖校區J1-105
系列講座第一場（選聽）: Reliability assessment and life time prediction (3x45min)
- stress environment and aging modelling
- Test by “aging acceleration”
- Lifetime prediction
- Industrial strategies
時間：10月17日18:30-20:55；地點：九龍湖校區J1-105
系列講座第二場（選聽）:Packaging and assemblies’ reliability
-Evolution of electronic assemblies technologies
-Main cause of aging and failure
-Techniques for failure analysis
-Assemblies design for reliability
時間：10月18日18:30-20:55；地點：九龍湖校區J1-105
系列講座第三場（選聽）:Reliability of complex systems
-Mission profiles of systems and specifications of use
-Impact of complexity on failure probability
-Redundancy and its limitations
-The new approach of reliability monitoring
時間：10月19日18:30-20:55；地點：九龍湖校區J1-105
系列講座第四場（選聽）:Reliability of high integrated semiconductor circuits
-Impact of down scaling on semiconductor IC
-Overview of DSM (Deep Sub Micronics) technologies
-Electromigration, Time Dependant Dielectric Breakdown ,
-High Current injection, Negative Bias -temperature Instability
時間：10月20日18:30-20:55；地點：九龍湖校區J1-105
教務處實踐教學科
課外研學講座活動指導中心
2018年10月12日
備注：課外研學講座是由教務處課外研學講座活動指導中心承辦的官方科技類講座，聽報告（講座）後，如實填寫講座現場發放的《學生聆聽科技、學術報告 學分認定書》并提供後續研學材料（如：評論、文獻綜述、讀書報告或報告人要求的文字材料等），經學生所在院系“課外研學活動指導小組”認定後可獲得0.2～0.4個課外研學學分。
